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International Journal of Computer Integrated Manufacturing

International Journal of Computer Integrated Manufacturing


Page and frequency increase from 2009 - Now 12 issues per year!
Call for Papers - Special Issue on 'Managing Costs through Life'
Published By: Taylor & Francis
Volume Number: 24
Frequency: 12 issues per year
Print ISSN: 0951-192X
Online ISSN: 1362-3052
 

Editorial Board

Editor-in-Chief:

Stephen Newman - Department of Mechanical Engineering, University of Bath, Bath, BA2 7AY, UK

Consulting Editors:

George Chryssolouris - Laboratory for Manufacturing Systems, Department of Mechanical Engineering and Aeronautics, University of Patras, Patras 26110, Greece
David J. Williams - Wolfson School of Mechanical and Manufacturing Engineering, Loughborough University, Loughborough, Leics, LE11 3TU, UK

Managing Editor and Book Reviews Editor:

Aydin Nassehi - Department of Mechanical Engineering, University of Bath, Bath, BA2 7AY, UK

North American Editors:

Paul G. Ranky - Department of Industrial and Manufacturing Engineering, New Jersey Institute of Technology, University Heights, Newark, NJ 07102, USA 
Paul K. Wright - Department of Mechanical Engineering, University of California, 5133 Etcheverry Hall, Berkeley, CA 94720-1740, USA

European Editor:

François Vernadat - IT & Telecommunications Division, European Court of Auditors, 12, rue Alcide de Gasperi, 1615 Luxembourg

Asian Editor:

George Huang - Department of Industrial and Manufacturing Systems Engineering, University of Hong Kong, Pokfulam Road, Hong Kong, China

International Editorial Board:

C. R. Boer - Istituto CIM della Svizzera Italiana, Switzerland
J. Browne - National University of Ireland, Galway
H. van Brussel - Katholieke Universiteit Leuven, Belgium
F. T. S. Chan - Hong Kong Polytechnic University, China
B.-K. Choi - KAIST, South Korea
I. Choi - Pohang University of Science and Technology, South Korea
H. A. ElMaraghy - University of Windsor, Ontario, Canada
P Muñoz Escalona - Universidad Simon Bolivar
Y. Fan - Tsinghua University, Beijing, China
P. Ferreira - University of Illinois at Urbana-Champaign, USA
Y. Furukawa - Tokyo Metropolitan University, Japan
N. N. Z. Gindy - University of Nottingham, UK
A. Gunasekaran - University of Massachusetts, USA
K. Hitomi - Kyoto University, Japan
S. Hobbs -  Delcam Plc, Birmingham, UK
S.-L. Hwang - National Tsing Hua University, Taiwan
M. Jeng - National Taiwan Ocean University, Taiwan
A. Jones - National Institute of Standards & Technology, USA
S. Joshi - Pennsylvania State University, USA
F. Jovane - Polytechnic of Milan, Italy
H. Katayama - Waseda University, Japan
K. Kosanke - CIMOSA, Böblingen, Germany
A. Kusiak - University of Iowa, USA
A. Molina - ITESM Monterrey, Mexico
L. B. Newnes - University of Bath, UK
S. Y. Nof - Purdue University, USA
P. O'Grady - University of Iowa, USA
H. Van Dyke Parunak - ERIM Center for Electronic Commerce, USA
P. Pokorny - Technical University of Liberec, Czech Republic
P. Rogers - University of Calgary, Canada
R. S. U. Rosso Jr. - Universidade do Estado de Santa Catarina
I. Sabuncuoglu - Bilkent University, Turkey
M. K. Tiwari - Indian Institute of Technology, Kharagpur, India
R. Uzsoy - North Carolina State University, USA
József Vancza - Hungarian Academy of Sciences (MTA), Hungary
 R. Veeramani - University of Wisconsin-Madison, USA
L. Wang - University of Skövde, Sweden 
H.-J. Warnecke
- Franunhofer-IPA, Germany
R. H. Weston - Loughborough University, UK
X. Xu - University of Auckland, New Zealand
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